Acronym Finder

Microscope optical near field typical microscope probe is to check the structures of the NM goes to work.

study the materials and structures in the size of the micro-and nano need to the microscope, with the power breakdown of the top. that because of the limitation of diffraction governs the microscope, the classic, in which lenses are used. to achieve this breakdown with the use of this generation of microscope, is not possible. In order to achieve this goal, the microscope, the SEM images – survey were built, in that they review point to the object or the desired level and collect information, they analyze this data can be attributed to the morphology and the properties of the surface of the sample desired....

Spectroscopy atomic absorption...

Microscope tunnel SEM images (STM) of any microscope probe SEM images, which is based on conductive surface by the tip of a very narrow ( few Nm ) and the change in the flow rate of the transmission according to the distance it works. Yet the microscope can be arrangement of atoms on the surface of the grid to the image, drew. In other words, the image created represents the spatial arrangement of the bar, the conductance of the metal or semiconductor.

flow in this species of microscope directly (DC) is flowing as you can with the distance tip-sample.
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Microscope, magnetic force (MFM) is a type of microscope developed from the idea of an atomic force microscope. This microscope from the changes in space the magnetic force between the sample surface and the tip of the county, for illustration uses....

Electron microscope, transmission or TEM, the kind of the electron microscope is the ability to capture the microstructure of materials with a magnification of 1, The 000 up to 1٬000٬000 equal to the power of separation in the limit of smaller than 1 nm. Microscope, transmission electron as well as the ability elemental Analyzer is to determine the structure and direction of the crystalline components to the small 30 Nm for quantitative and qualitative....

Atomic force microscopy or force microscopy in 1986 by , etc. Bening, and Gerber invented.

like all microscopes, the probe other, a probe (probe) is sharp, that on the surface of the sample under investigation move, uses....

The diffraction (scattering) X-ray method for the study of the structure of the material is crystalline, which in the year 1912 ad, by the application of the Lau was discovered by William Henry Bragg and William Lawrence Bragg, to check the crystals, was applied.

UV that for the diffraction are used, etc., usually during a wave of about 0.5 Eli 2.5 purpose.

This method is based on the basic property of a wave X-rays is based. The nucleus of an atom in the crystal lattice to a little distance (about a few purpose) from each other." Of reflected X-rays from these pages are consecutive, leading to the interference constructive or devastating waves of X can be. If the waves interfere constructively. using the formula of Bragg, can be spaced pages, crystalline and, consequently, the size and type of unit cell, division....

Spectrum spectrometry (MS) is one of the methods of spectroscopy that involves the separation of ions of one or a few atomic based on the ratio of mass to time (m/z) and measuring the m/z and abundance of ions in the gas phase. To put it more accurately, spectrum, spectrometry to examine the ratio of the mass to load molecules using electric and Magnetic Fields pays....